Sains Malaysiana 54(4)(2025): 1187-1207

http://doi.org/10.17576/jsm-2025-5404-18

 

Optimising Variable Sample Size Chart through Median Run Length with Estimated Process Parameters

(Mengoptimumkan Saiz Sampel Pemboleh Ubah Carta  melalui Panjang Larian Median dengan Parameter Proses Anggaran)

 

WEI LIN TEOH1,2,*, KAI LE GOH1, ZHI LIN CHONG3, XINYING CHEW4, MING HA LEE5 &

KHAI WAH KHAW6

 

1School of Mathematical and Computer Sciences, Heriot-Watt University Malaysia, 62200 Putrajaya, Malaysia

2International Chair in Data Science & Explainable Artificial Intelligence, International Research Institute for Artificial Intelligence and Data Science, Dong A University, Danang, Vietnam

3Department of Electronic Engineering, Faculty of Engineering and Green Technology, Universiti Tunku Abdul Rahman, 31900 Kampar, Perak, Malaysia

4School of Computer Science, Universiti Sains Malaysia, 11800 Gelugor, Pulau Pinang, Malaysia

5Faculty of Engineering, Computing and Science, Swinburne University of Technology Sarawak Campus, 93350 Kuching, Sarawak, Malaysia

6School of Management, Universiti Sains Malaysia, 11800 Gelugor, Pulau Pinang, Malaysia

 

Diserahkan: 30 Ogos 2024/Diterima: 18 Disember 2024

 

Abstract

The classic charting procedures for designing the estimated process parameters-based variable sample size (VSS) chart rely on the average run length (ARL) criterion. Nevertheless, variations in the number of Phase-I samples and sample size, as well as the magnitude of the process mean shift affect the skewness of the run-length distribution for a control chart. Hence, we claim that the ARL can be a misleading metric when adopted in the estimated process parameters-based control charts. Instead, examining percentiles of the run-length distribution, which focus on the run-length behaviour, are more realistic and intuitive. From this point of view, this paper aims to develop two new optimal VSS charts using estimated process parameters, by minimising the (i) median run length (MRL) and (ii) expected MRL criteria, for known and unknown shift-size cases, respectively. Besides, the 5th and 95th percentiles are computed to closely examine the variability of the run length. In this paper, two VSS schemes that involve estimated process parameters are investigated extensively, i.e., the first sample size can be either small or large. Various practically manageable Phase-I sample sizes and magnitudes of process mean shift are implemented in the optimal design of the proposed charts. The results ascertain that the proposed optimal VSS  charts based on estimated process parameters not only provide a comprehensible interpretation for quality practitioners, but also give a low false-alarm rate. The proposed optimal charts are illustrated using real data from a wafer substrate manufacturing company.

Keywords: median run length; optimal design; percentile of the run-length distribution; process parameter estimation; variable sample size chart

 

Abstrak

Prosedur carta klasik untuk mereka carta bersaiz sampel berubah-ubah (VSS) berdasarkan anggaran parameter proses adalah bergantung pada kriteria panjang larian purata (ARL). Namun begitu, variasi dalam bilangan sampel Fasa-I dan saiz sampel, serta magnitud anjakan purata proses mempengaruhi kepencongan taburan panjang larian untuk carta kawalan. Oleh itu, kami berpendapat bahawa ARL merupakan metrik yang mengelirukan apabila digunakan dalam carta kawalan berdasarkan parameter proses yang dianggarkan. Sebaliknya, pemeriksaan percentil taburan panjang larian yang memberi tumpuan kepada tingkah laku panjang larian adalah lebih realistik dan intuitif. Dari sudut pandangan ini, kajian ini bertujuan untuk mencipta dua reka bentuk optimum baharu bagi carta VSS berdasarkan parameter proses yang dianggarkan dengan meminimumkan kriteria masing-masing untuk (i) panjang larian median (MRL) dan (ii) jangkaan MRL untuk kes perubahan saiz anjakan yang diketahui dan tidak diketahui. Selain itu, percentil ke-5 dan ke-95 dikira dengan teliti untuk mengukur variabiliti dalam panjang larian. Dalam kajian ini, dua skim VSS yang melibatkan parameter proses yang dianggarkan dikaji dengan secara mendalam, iaitu, saiz sampel pertama adalah sama dengan kecil atau besar. Pelbagai saiz sampel Fasa-I yang mudah diurus dan magnitud anjakan purata proses digunakan dalam reka bentuk optimum carta yang dicadangkan. Hasil kajian kami menunjukkan bahawa carta VSS optimum yang dicadangkan berdasarkan parameter proses yang dianggarkan bukan sahaja memberikan tafsiran yang komprehensif kepada pengamal kualiti, tetapi juga memberikan kadar amaran palsu yang rendah. Carta optimum yang dicadangkan diilustrasikan dengan menggunakan data sebenar daripada sebuah syarikat pembuatan substrat wafer.

Kata kunci: Anggaran proses parameter; carta bersaiz sampel berubah-ubah; panjang larian median; reka bentuk optimum; taburan peratusan panjang larian

 

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*Pengarang untuk surat-menyurat; email: wei_lin.teoh@hw.ac.uk

 

 

 

 

 

 

 

           

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